Mrs. Nadine Werth
at Technische Univ München
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Image fusion, Digital filtering, Wavefronts, Linear filtering, Optical testing, Time metrology, Gaussian filters, Image filtering, Nonlinear filtering, Data fusion

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