Prof. Nagahisa Ogasawara Profile

Prof. Nagahisa Ogasawara

Professor at National Defense Academy

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Publications (5)

Proceedings Article | 5 May 2017 Paper

Infrared image correction for the reduction of background reflection

N. Ogasawara, C. Kobayashi, H. Yamada

Proceedings Volume 10214, 102141E (2017) https://doi.org/10.1117/12.2262400

KEYWORDS: Refractive index, Temperature metrology, Dielectrics, Thermography, Reflection, Infrared imaging, Infrared radiation, Reflectivity, Image processing, Buildings

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Proceedings Article | 12 May 2015 Paper

Evaluation of angle dependence in spectral emissivity of ceramic tiles measured by FT-IR

C. Kobayashi, N. Ogasawara, H. Yamada, S. Yamada, T. Kikuchi

Proceedings Volume 9485, 948508 (2015) https://doi.org/10.1117/12.2176965

KEYWORDS: FT-IR spectroscopy, Thermography, Infrared radiation, Ceramics, Black bodies, Temperature metrology, Inspection, Radium, Infrared imaging, Refractive index

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Proceedings Article | 12 May 2015 Paper

Active infrared thermographic testing with distance heating

N. Ogasawara, H. Ando, C. Kobayashi, H. Yamada

Proceedings Volume 9485, 94850A (2015) https://doi.org/10.1117/12.2176961

KEYWORDS: Black bodies, Far infrared, Near infrared, Infrared radiation, Coating, Halogens, Energy efficiency, Tungsten, Quartz, Thermography

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Proceedings Article | 10 May 2011 Paper

Thinning identification technique using stainless steel film heater and response surface method

Nagahisa Ogasawara, Hiroyuki Yamada

Proceedings Volume 8013, 80130Y (2011) https://doi.org/10.1117/12.885605

KEYWORDS: Thermography, Inspection, Metals, Infrared cameras, Nondestructive evaluation, Temperature metrology, Infrared radiation, Cameras, Thermal imaging cameras, Resistance

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Proceedings Article | 4 April 1997 Paper

Application of infrared thermography to fracture mechanics

Nagahisa Ogasawara, Masaki Shiratori

Proceedings Volume 3056, (1997) https://doi.org/10.1117/12.271644

KEYWORDS: Image processing, Thermography, Temperature metrology, Mechanics, Televisions, Measurement devices, Infrared radiation, Computing systems, Nondestructive evaluation, Finite element methods

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