Prof. Nai-Jen Cheng
Assistant Professor at National Kaohsiung Univ of Applied Sciences
SPIE Involvement:
Author
Publications (19)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
KEYWORDS: Photonic devices, Fringe analysis, Reliability, Optical inspection, Data processing, Phase shifts

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
KEYWORDS: Photonic devices, Optical sensing, 3D surface sensing, Inspection, Optical inspection, 3D metrology, Projection systems, Binary data

PROCEEDINGS ARTICLE | September 7, 2016
Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X
KEYWORDS: Fringe analysis, Photonic crystal fibers, Inspection, Reflectivity, Computer programming, Time metrology, 3D metrology, Transmittance, Binary data, Phase shifts

PROCEEDINGS ARTICLE | September 7, 2016
Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X
KEYWORDS: Beam splitters, Light sources, Fringe analysis, Image processing, Inspection, Fourier transforms, CCD cameras, 3D metrology, 3D image processing, Bandpass filters

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX
KEYWORDS: Beam splitters, Fringe analysis, 3D image enhancement, Cameras, Image processing, Inspection, CCD cameras, 3D metrology, Image filtering, 3D image processing

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII
KEYWORDS: Mirrors, Fringe analysis, Holograms, Holography, Reflection, Glasses, Inspection, CCD cameras, 3D metrology, Projection devices

Showing 5 of 19 publications
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