Prof. Nai-Jen Cheng
Assistant Professor at National Kaohsiung Univ of Applied Sciences
SPIE Involvement:
Author
Publications (19)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
KEYWORDS: Fringe analysis, Phase shifts, Optical inspection, Data processing, Reliability, Photonic devices

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
KEYWORDS: 3D metrology, Binary data, 3D surface sensing, Optical sensing, Optical inspection, Projection systems, Inspection, Photonic devices

PROCEEDINGS ARTICLE | September 7, 2016
Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X
KEYWORDS: Fringe analysis, Phase shifts, Computer programming, Reflectivity, Binary data, Inspection, Transmittance, 3D metrology, Time metrology, Photonic crystal fibers

PROCEEDINGS ARTICLE | September 7, 2016
Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X
KEYWORDS: 3D metrology, 3D image processing, Image processing, Inspection, CCD cameras, Bandpass filters, Fringe analysis, Fourier transforms, Beam splitters, Light sources

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX
KEYWORDS: Inspection, 3D metrology, 3D image processing, Fringe analysis, CCD cameras, Image processing, Cameras, Beam splitters, Image filtering, 3D image enhancement

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII
KEYWORDS: Holograms, Fringe analysis, Inspection, Glasses, 3D metrology, CCD cameras, Reflection, Mirrors, Projection devices, Holography

Showing 5 of 19 publications
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