Dr. Nan Xu
at National Institute of Metrology
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Light sources, Metrology, Sensors, Calibration, Silicon, Quantum efficiency, Radiometry, Standards development

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Photodetectors, Calibration, Silicon, Spectral calibration, Radiometry, Cryogenics

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
KEYWORDS: Infrared sensors, Near infrared, Photon counting, Sensors, Calibration, Ultraviolet radiation, Quantum efficiency, Superconductors, Single photon detectors, Nanowires

PROCEEDINGS ARTICLE | October 8, 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Optical fibers, Indium gallium arsenide, Sensors, Calibration, Photodiodes, Optical testing, Collimation, Transmittance, Radiometry, Cryogenics

PROCEEDINGS ARTICLE | October 8, 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Photodetectors, Beam splitters, Waveguides, Calibration, Crystals, Picosecond phenomena, Oscilloscopes, Electro optics, Microwave radiation, Signal detection

PROCEEDINGS ARTICLE | November 18, 2014
Proc. SPIE. 9269, Quantum and Nonlinear Optics III
KEYWORDS: Lithium, Modulation, Imaging systems, Crystals, Image restoration, Fourier transforms, Nonlinear optics, Laser crystals, Nonlinear crystals, Crystallography

Showing 5 of 9 publications
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