Dr. Nan Xu
at National Institute of Metrology
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 12 March 2020
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Optical fibers, Laser sources, Photodetectors, Light sources, Light emitting diodes, Biomedical optics, Sensors, Photons, Single photon, Optical testing

Proceedings Article | 12 March 2020
Proc. SPIE. 11436, 2019 International Conference on Optical Instruments and Technology: Optical Sensors and Applications
KEYWORDS: Photon counting, Metrology, Sensors, Superconductors, Amplifiers, Device simulation

Proceedings Article | 12 March 2020
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Photon counting, Imaging systems, Cameras, Sensors, Calibration, Quantum efficiency, Digital cameras, Photonics systems, Spectral calibration, Integrating spheres

Proceedings Article | 18 December 2019
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Metrology, Calibration, Remote sensing, Optical testing, Black bodies, Radiometry, Cryogenics

Proceedings Article | 18 December 2019
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Tunable lasers, Optical sensors, Sensors, Calibration, Lamps, Spectral calibration, Integrating spheres, Radiometry, Sensor calibration, Optical calibration

Showing 5 of 14 publications
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