Dr. Naoki Hayashi
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 February 2020
Proc. SPIE. 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII
KEYWORDS: Tomography, Phase conjugation, Phase measurement, 3D image processing, Distortion, Wavefronts, Computer programming

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