Dr. Naoki Ohashi
Senior Researcher at National Institute for Materials Science
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 February 2009
Proc. SPIE. 7216, Gallium Nitride Materials and Devices IV
KEYWORDS: Diffraction, Chemical species, Luminescence, Nitrogen, Raman spectroscopy, Gallium nitride, Phonons, Epitaxy, Gallium, Temperature metrology

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