Prof. Naoto Kakuta
at Tokyo Metropolitan Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 March 2019
Proc. SPIE. 11049, International Workshop on Advanced Image Technology (IWAIT) 2019
KEYWORDS: Near infrared, Optimization (mathematics), Temperature metrology, Absorption, Visualization, 3D metrology, Optical testing, Cameras

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