Naoya Taki
at Univ of Tokushima
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 5, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Diffraction, Polarization, Nanoparticles, Particles, Interfaces, Silicon, Polarizers, Numerical analysis, Optical tweezers, Phase measurement

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