Dr. Naresh C. Das Profile

Dr. Naresh C. Das

Principal Scientist/Physicist at US Army Research Lab

SPIE Involvement:

Conference Program Committee | Author

Publications (16)

PROCEEDINGS ARTICLE | September 24, 2018

Combined effect of plasmonic interaction of nano-particles

Proc. SPIE. 10720, Nanophotonic Materials XV

KEYWORDS: Gold, Plasmonics, Plasmons, Metals, Particles, Silicon, Aluminum, Spiral phase plates, Neptunium, Absorption

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PROCEEDINGS ARTICLE | May 11, 2012

Performance of bottom emitting isolated LWIR LED devices for IR scene projection

Proc. SPIE. 8356, Technologies for Synthetic Environments: Hardware-in-the-Loop XVII

KEYWORDS: Long wavelength infrared, FT-IR spectroscopy, Quantum wells, Light emitting diodes, Etching, Metals, Silicon, Gallium antimonide, Infrared radiation, Wet etching

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PROCEEDINGS ARTICLE | May 13, 2011

MWIR LED performance enhancement by nano-plasmon layer

Proc. SPIE. 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI

KEYWORDS: Gold, Mid-IR, Plasmons, FT-IR spectroscopy, Surface plasmons, Quantum wells, Light emitting diodes, Sensors, Metals, Gallium antimonide

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PROCEEDINGS ARTICLE | April 24, 2010

Two color IR LED array

Proc. SPIE. 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV

KEYWORDS: Long wavelength infrared, Mid-IR, Light sources, Quantum wells, Light emitting diodes, Electroluminescence, Gallium antimonide, Optical testing, Infrared radiation, Cryogenics

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PROCEEDINGS ARTICLE | February 24, 2010

Grating coupled enhancement of light emission from IR light emitting diode devices

Proc. SPIE. 7617, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIV

KEYWORDS: Long wavelength infrared, Mid-IR, Quantum wells, Lithium, Light emitting diodes, Etching, Electroluminescence, Gallium antimonide, Optical testing, Cryogenics

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PROCEEDINGS ARTICLE | April 23, 2009

Effects of indium mole fraction on LWIR light-emitting device performance

Proc. SPIE. 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV

KEYWORDS: Long wavelength infrared, Quantum wells, Light emitting diodes, Indium, Silicon, Electroluminescence, Gallium antimonide, Infrared radiation, Semiconducting wafers, Cryogenics

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PROCEEDINGS ARTICLE | April 16, 2008

Performance of 64x64 MWIR super lattice light-emitting diode (SLED) array for IR scene generation

Proc. SPIE. 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII

KEYWORDS: Mid-IR, Switches, Light emitting diodes, Capacitors, Cameras, Metals, Gallium antimonide, Black bodies, Body temperature, Superlattices

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PROCEEDINGS ARTICLE | May 16, 2006

MWIR LED array for high temperature target simulation

Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI

KEYWORDS: Mid-IR, Light emitting diodes, Indium, Silicon, Nitrogen, Gallium antimonide, Helium, Superlattices, Liquids

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PROCEEDINGS ARTICLE | May 20, 2005

Light emitting diode arrays for HWIL sensor testing

Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X

KEYWORDS: Mid-IR, Light emitting diodes, Sensors, Nitrogen, Gallium antimonide, Black bodies, Projection systems, Resistors, Body temperature, Liquids

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PROCEEDINGS ARTICLE | August 4, 2004

Design and fabrication of 2xD light emitting device arrays for IR scene projection

Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX

KEYWORDS: Infrared cameras, Light emitting diodes, Sensors, Gallium antimonide, Black bodies, Infrared radiation, Analytical research, Resistors, Temperature metrology, Light

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PROCEEDINGS ARTICLE | July 26, 1999

Fabrication and evaluation of 11.2- and 16.2-um cutoff C-QWIP arrays

Proc. SPIE. 3698, Infrared Technology and Applications XXV

KEYWORDS: Staring arrays, Infrared imaging, Quantum wells, Clocks, Cameras, Sensors, Gallium arsenide, Indium, Infrared radiation, Quantum well infrared photodetectors

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PROCEEDINGS ARTICLE | April 8, 1998

Corrugated QWIP array fabrication and characterization

Proc. SPIE. 3287, Photodetectors: Materials and Devices III

KEYWORDS: Staring arrays, Quantum wells, Sensors, Quantum efficiency, Detector arrays, Wet etching, Neon, Reactive ion etching, Quantum well infrared photodetectors, Absorption

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PROCEEDINGS ARTICLE | April 8, 1998

Silicon JFETs for cryogenic applications

Proc. SPIE. 3287, Photodetectors: Materials and Devices III

KEYWORDS: Silicon, Diffusion, Nitrogen, Oxygen, Space telescopes, Field effect transistors, Cryogenics, Temperature metrology, Liquids, Oxidation

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PROCEEDINGS ARTICLE | August 25, 1997

New method for end-point detection in reactive ion etching of polysilicon

Proc. SPIE. 3213, Process, Equipment, and Materials Control in Integrated Circuit Manufacturing III

KEYWORDS: Oxides, Thin films, Ellipsometry, Silica, Etching, Ions, Silicon, Reactive ion etching, Semiconducting wafers, Plasma

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PROCEEDINGS ARTICLE | June 23, 1994

Hole trapping in MOSFET by hot carrier stressing and ionizing irradiation at 77K

Proc. SPIE. 2226, Infrared Readout Electronics II

KEYWORDS: Annealing, Ionizing radiation, Field effect transistors

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PROCEEDINGS ARTICLE | July 1, 1992

New technique for measuring the ionizing radiation effects in metal oxide semiconductor transistors

Proc. SPIE. 1686, Test and Evaluation of IR Detectors and Arrays II

KEYWORDS: Semiconductors, Oxides, Metals, Ionizing radiation, Interfaces, Ionizing radiation effects, Transistors, Field effect transistors, Radiation effects, Molybdenum

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Showing 5 of 16 publications

Conference Committee Involvement (5)

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV

7 April 2010 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV

13 April 2009 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII

17 March 2008 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII

10 April 2007 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI

18 April 2006 | Orlando (Kissimmee), Florida, United States

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