Mr. Naresh Chandra Murmu
at Univ Erlangen-Nürnberg
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Defect detection, Visualization, Metals, Manufacturing, Inspection, Clouds, Optical testing, CCD cameras, Projection systems, Digital micromirror devices

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