Prof. Nathan E. Israeloff
at Northeastern Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 June 2007 Paper
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Sensors, Polymers, Glasses, Microscopy, Dielectrics, Capacitance, Scanning probe microscopy, Polymer thin films, Dielectric polarization, Correlation function

Proceedings Article | 9 May 2003 Paper
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Modulation, Polarization, Polymers, Glasses, Molecules, Dielectrics, Capacitance, Shape analysis, Dielectric polarization, Liquids

Proceedings Volume Editor (1)

SPIE Conference Volume | 9 May 2003

Conference Committee Involvement (3)
Fluctuations and Noise in Materials II
24 May 2005 | Austin, Texas, United States
Fluctuations and Noise in Materials
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise as a Tool for Studying Materials
2 June 2003 | Santa Fe, New Mexico, United States
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