Dr. Nazif Demoli
Researcher at Institut Za Fiziku
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (38)

PROCEEDINGS ARTICLE | May 3, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Signal to noise ratio, Signal to noise ratio, Photon counting, Fringe analysis, Holograms, Holography, Digital holography, Digital holography, Sensors, Interference (communication), Charge-coupled devices, Digital recording, CCD image sensors, Signal detection

PROCEEDINGS ARTICLE | May 23, 2013
Proc. SPIE. 8792, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
KEYWORDS: FT-IR spectroscopy, Medicine, Dubnium, Teeth, Polymers, Composites, Physics, Composite resins, Polymerization, Temperature metrology

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Fringe analysis, Holograms, Holography, 3D image reconstruction, Digital holography, Charge-coupled devices, Spatial resolution, Digital recording, Holographic interferometry, CCD image sensors

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Superposition, Fringe analysis, Holograms, Holography, 3D image reconstruction, Digital holography, Sensors, Interferometry, Wavefronts, Holographic interferometry

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 7000, Optical and Digital Image Processing
KEYWORDS: Statistical analysis, Digital image processing, Physics, Image analysis, Distance measurement, Image classification, Optical character recognition, Analog electronics, Binary data, Prototyping

SPIE Journal Paper | September 1, 2005
OE Vol. 44 Issue 09
KEYWORDS: Digital holography, Holograms, Mirrors, 3D image reconstruction, Fringe analysis, Sensors, Digital cameras, Fourier transforms, Beam splitters, Digital recording

Showing 5 of 38 publications
Conference Committee Involvement (2)
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
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