Dr. Neil A. Beaudry
Research Scientist at Axometrics Inc
SPIE Involvement:
Publications (11)

SPIE Journal Paper | 1 July 2008 Open Access
David Salyer, Kurt Denninghoff, Neil Beaudry, Sreenivasa Basavanthappa, Robert Park, Russell Chipman
JBO, Vol. 13, Issue 04, 044004, (July 2008) https://doi.org/10.1117/12.10.1117/1.2966953
KEYWORDS: Reflectivity, Retina, Eye, Transmittance, Sensors, Light scattering, In vivo imaging, Image filtering, Fiber optic illuminators, Absorption

SPIE Journal Paper | 1 January 2006 Open Access
JBO, Vol. 11, Issue 01, 014028, (January 2006) https://doi.org/10.1117/12.10.1117/1.2166407
KEYWORDS: Refractive index, Prisms, Polarization, Glasses, Polarizers, Calibration, Prototyping, Ellipsometry, Wave plates, Interfaces

Proceedings Article | 18 August 2005 Paper
Proceedings Volume 5888, 58880A (2005) https://doi.org/10.1117/12.621527
KEYWORDS: Modulators, Modulation, Polarization, Photoelastic modulators, Resonators, Sensors, Polarizers, Polarimetry, Phase shift keying, Acoustics

Proceedings Article | 18 August 2005 Paper
Proceedings Volume 5888, 588808 (2005) https://doi.org/10.1117/12.618163
KEYWORDS: Dielectrics, Dielectric polarization, Microscopes, Objectives, Reflection, Ellipsometry, Data modeling, Thin films, Polarizers, Jones matrices

SPIE Journal Paper | 1 July 2005
OE, Vol. 44, Issue 07, 078001, (July 2005) https://doi.org/10.1117/12.10.1117/1.1948398
KEYWORDS: Imaging systems, Speckle, Point spread functions, Line edge roughness, Coherence (optics), Speckle pattern, Scattering, Photoresist materials, Fractal analysis, Surface roughness

Showing 5 of 11 publications
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