Nguyen Thien
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 March 2020 Presentation
Proceedings Volume 11243, 112431C (2020) https://doi.org/10.1117/12.2545967
KEYWORDS: Diffuse reflectance spectroscopy, Reflectance spectroscopy, Spectroscopy, Chromophores, Process modeling, Data modeling, Statistical analysis, Statistical modeling, Spectral resolution, Neural networks

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