Dr. Ni Jun
at China Jiliang Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 25, 2009
Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
KEYWORDS: Optical systems, Detection and tracking algorithms, Image processing, Image analysis, Optical testing, Image quality, Digital imaging, Precision measurement, Optical tracking, Precision optics

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