Nicholas P. Calvano
at Delaware State Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 18 September 2018 Presentation + Paper
Proc. SPIE. 10766, Infrared Sensors, Devices, and Applications VIII
KEYWORDS: Thin films, Refractive index, Capacitors, Crystals, Dielectrics, Reflectivity, Transmittance, Aluminum, Temperature metrology, Absorption

Proceedings Article | 23 August 2017 Paper
Proc. SPIE. 10381, Wide Bandgap Power Devices and Applications II
KEYWORDS: Thin films, Refractive index, Capacitors, Polarization, Sputter deposition, Scanning electron microscopy, Transmittance, Aluminum, pyroelectric detectors, Temperature metrology

Proceedings Article | 28 April 2017 Presentation + Paper
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Sputter deposition, Crystals, pyroelectric detectors, Pyroelectricity, Temperature metrology

Proceedings Article | 28 April 2017 Presentation + Paper
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Infrared sensors, Sputter deposition, Silicon, Aluminum, Aluminum nitride, pyroelectric detectors, Infrared detection, Dielectric polarization, Temperature metrology

Proceedings Article | 9 June 2014 Paper
Proc. SPIE. 9080, Laser Radar Technology and Applications XIX; and Atmospheric Propagation XI
KEYWORDS: Reflectors, Avalanche photodetectors, Polarization, Imaging systems, LIDAR, Sensors, Polarizers, Wave plates, Polarimetry, Spatial resolution

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