Mr. Nico Kaemmer Profile

Nico Kaemmer

at Carl Zeiss Microscopy GmbH

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 26 March 2019 Paper

C. Riedesel, I. Müller, N. Kaufmann, A. Adolf, N. Kämmer, H. Fritz, A. L. Eberle, D. Zeidler

Proceedings Volume 10959, 1095931 (2019) https://doi.org/10.1117/12.2528795

KEYWORDS: Scanning electron microscopy, Sensors, Electron beams, Electron microscopes, Semiconductors, Electron microscopy

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Keywords/Phrases