Nicolas Bonnot
at Univ de Bourgogne
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 3, 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Defect detection, Cameras, Image segmentation, Image processing, Manufacturing, Inspection, Control systems, Light sources and illumination, Machine vision, Scene classification

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