Dr. Nicolas Sanner
at Lasers, Plasmas et Procédés Photoniques
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | March 14, 2016
Proc. SPIE. 9735, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXI
KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Silica, Dielectrics, Laser ablation, Sapphire, Ionization, Beam propagation method, Pulsed laser operation

PROCEEDINGS ARTICLE | November 17, 2014
Proc. SPIE. 9237, Laser-Induced Damage in Optical Materials: 2014
KEYWORDS: Ultrafast phenomena, Mirrors, Laser induced damage, Laser applications, Optical testing, Laser ablation, Ionization, Laser damage threshold, Beam propagation method, Pulsed laser operation

PROCEEDINGS ARTICLE | July 9, 2013
Proc. SPIE. 8786, Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers
KEYWORDS: Mirrors, Femtosecond phenomena, Laser induced damage, Laser applications, Laser development, Laser ablation, Ionization, Neodymium, Pulsed laser operation, Laser-matter interactions

PROCEEDINGS ARTICLE | May 7, 2013
Proc. SPIE. 8780, High-Power, High-Energy, and High-Intensity Laser Technology; and Research Using Extreme Light: Entering New Frontiers with Petawatt-Class Lasers
KEYWORDS: Laser sources, Femtosecond phenomena, Silica, Laser induced damage, Dielectrics, Laser ablation, Ionization, Laser damage threshold, Pulsed laser operation, Absorption

PROCEEDINGS ARTICLE | March 15, 2013
Proc. SPIE. 8611, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII
KEYWORDS: Semiconductors, Femtosecond phenomena, Silica, Photons, Dielectrics, Silicon, Solids, Ionization, Pulsed laser operation, Absorption

PROCEEDINGS ARTICLE | February 22, 2011
Proc. SPIE. 7920, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVI
KEYWORDS: Modeling, Femtosecond phenomena, Silica, Laser energy, Dielectrics, Laser ablation, Ionization, Laser damage threshold, Pulsed laser operation, Absorption

Showing 5 of 14 publications
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