Dr. Nicolas Vannier
Optronics Engineer at Thales LAS France SAS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 4, 2016
Proc. SPIE. 9853, Polarization: Measurement, Analysis, and Remote Sensing XII
KEYWORDS: Image processing algorithms and systems, Infrared imaging, Mueller matrices, Polarization, Imaging systems, Image segmentation, Manufacturing, Polarimetry, Electroluminescent displays, Polysomnography

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