Dr. Niklas J. Karpe
at Zarlink Semiconductor
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 March 2003 Paper
Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.468635
KEYWORDS: Resistance, Temperature metrology, Adhesives, Copper, Prototyping, Aluminum, Thermography, Vertical cavity surface emitting lasers, Nanoimprint lithography, Velocity measurements

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