Dr. Niklas J. Karpe
at Zarlink Semiconductor
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 March 2003
Proc. SPIE. 4945, MEMS/MOEMS: Advances in Photonic Communications, Sensing, Metrology, Packaging and Assembly
KEYWORDS: Resistance, Temperature metrology, Adhesives, Copper, Prototyping, Aluminum, Thermography, Vertical cavity surface emitting lasers, Nanoimprint lithography, Velocity measurements

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top