Prof. Niklas Sandler
at Åbo Akademi Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Calibration, Standards development, 3D metrology, Solids, 3D image processing, Neodymium, Time metrology, Mirrors, 3D imaging standards, Metrology

Proceedings Article | 20 February 2017
Proc. SPIE. 10110, Photonic Instrumentation Engineering IV
KEYWORDS: Photonic devices, 3D imaging standards, 3D metrology, Confocal microscopy, Phase interferometry, Interferometers, Calibration, Standards development, Optical fabrication, Optical interferometry, Objectives, Microscopes, Light sources, Mirrors

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