Prof. Nikolay G. Galkin
at Institute for Automation and Control Processes
SPIE Involvement:
Author
Publications (11)

PROCEEDINGS ARTICLE | April 13, 2012
Proc. SPIE. 8409, Third International Conference on Smart Materials and Nanotechnology in Engineering
KEYWORDS: Semiconductors, Magnesium, Iron, Silicon, Resistance, Doping, Electroluminescence, Nanocrystals, Nanocomposites, Temperature metrology

PROCEEDINGS ARTICLE | November 13, 2007
Proc. SPIE. 6423, International Conference on Smart Materials and Nanotechnology in Engineering
KEYWORDS: Ultrafast phenomena, Thin films, Lithium, Iron, Capacitors, Chemical species, Silicon, Magnetism, Atomic force microscopy, Silicon films

PROCEEDINGS ARTICLE | September 18, 2007
Proc. SPIE. 6669, Seventh International Conference on Solid State Lighting
KEYWORDS: Iron, Annealing, Luminescence, Crystals, Ions, Silicon, Reflectivity, Atomic force microscopy, Ion implantation, Heterojunctions

PROCEEDINGS ARTICLE | June 8, 2005
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Thin films, Chemical species, Annealing, Dielectrics, Silicon, Diffusion, Atomic force microscopy, Silicon films, Ytterbium, Absorption

PROCEEDINGS ARTICLE | June 8, 2005
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Thin films, Magnesium, Reflection, Annealing, Crystals, Dielectrics, Electrons, Silicon, Silicon films, Absorption

PROCEEDINGS ARTICLE | June 8, 2005
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Magnesium, Spectroscopy, Annealing, Crystals, Dielectrics, Electrons, Silicon, Reflectivity, Atomic force microscopy, Silicon films

Showing 5 of 11 publications
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