Mr. Nil Franch Profile

Nil Franch

at Univ de Barcelona

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Author

Publications (4)

Proceedings Article | 5 March 2021 Presentation + Paper

Ultra-compact and large field-of-view nano-illumination light microscope based on an array of organic light-emitting diodes

A. Vilà, S. Moreno, J. Canals, V. Moro, N. Franch, P. Wartenberg, A. Dieguez

Proc. SPIE. 11693, Photonic Instrumentation Engineering VIII

KEYWORDS: Microscopes, Photodetectors, Light sources, Light emitting diodes, Switching, Lenses, Organic light emitting diodes, Microscopy, Image resolution, Prototyping

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Proceedings Article | 5 March 2021 Presentation + Paper

A nano-illumination microscope with 7 mm2 extended field-of-view and resolution below 1µm

S. Moreno, J. Canals, V. Moro, N. Franch, A. Vilà, A. Romano, J. Prades, D. Bezshlyakh, A. Waag, S. Krieger, S. Geleff, A. Diéguez

Proc. SPIE. 11651, Optical Diagnostics and Sensing XXI: Toward Point-of-Care Diagnostics

KEYWORDS: Microscopes, Light emitting diodes, Super resolution, Microscopy, Optical microscopy, Image restoration, Life sciences, Image sensors, Reconstruction algorithms, Medical devices

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Proceedings Article | 30 March 2020 Presentation + Paper

A shadow image microscope based on an array of nanoLEDs

Joan Canals, Victor Moro, Nil Franch, Sergio Moreno, Oscar Alonso, Anna Vilà, Juan Daniel Prades, Jan Gülink, Daria Bezshlyakh, Andreas Waag, Angel Diéguez

Proc. SPIE. 11351, Unconventional Optical Imaging II

KEYWORDS: Microscopes, CMOS sensors, Light emitting diodes, Cameras, Sensors, Image processing, Microscopy, Image resolution, Image sensors

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Proceedings Article | 9 September 2019 Paper

Towards a super-resolution structured illumination microscope based on an array of nanoLEDs

Nil Franch, Joan Canals, Victor Moro, Oscar Alonso, Sergio Moreno, Anna Vilà, Joan Daniel Prades, Jan Gülink, Hutomo Suryo Wasisto, Andreas Waag, Ángel Diéguez

Proc. SPIE. 11105, Novel Optical Systems, Methods, and Applications XXII

KEYWORDS: Microscopes, Light sources, Electronics, Light emitting diodes, Super resolution, Sensors, Microscopy, Control systems, Prototyping

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