Dr. Nima Davoudzadeh
at
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 8, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Wafer-level optics, Defect detection, Polarization, Imaging systems, Scattering, Silicon, Inspection, Computer simulations, Bridges, Semiconducting wafers, Signal detection, Electromagnetism, Near field optics, Defect inspection

PROCEEDINGS ARTICLE | April 7, 2009
Proc. SPIE. 7288, Active and Passive Smart Structures and Integrated Systems 2009
KEYWORDS: Radar, Nickel, Silicon, Scanning electron microscopy, Terahertz radiation, Antennas, Medium wave, Microwave radiation, Device simulation, Carbon nanotubes

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