Mr. No-Kap Park Profile

No-Kap Park

at SAMSUNG SDI Co Ltd

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Author

Publications (3)

SPIE Journal Paper | 1 July 2008

Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception

No-Kap Park, Suk In Yoo

JEI Vol. 17 Issue 03

KEYWORDS: Visibility, Visualization, Thin films, Transistors, Inspection, Defect detection, Detection and tracking algorithms, Liquid crystals, LCDs, Feature extraction

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Proceedings Article | 26 February 2008

Directional filter banks for detecting un-patterned TFT-LCD defect

No Kap Park, Hye Won Kim, Suk In Yoo

Proc. SPIE. 6813, Image Processing: Machine Vision Applications

KEYWORDS: Eye, Edge detection, Defect detection, Detection and tracking algorithms, Sensors, Image segmentation, Image processing, Manufacturing, LCDs, Image filtering

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Proceedings Article | 18 January 2006

Quantification of line mura defect levels based on multiple characterizing features

No K. Park, Kyu N. Choi, Suk I. Yoo

Proc. SPIE. 6066, Vision Geometry XIV

KEYWORDS: Visual process modeling, Detection and tracking algorithms, Visualization, Complex systems, Manufacturing, Inspection, Optical inspection, Distance measurement, Computer engineering, Visibility

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