No-Kap Park
at SAMSUNG SDI Co Ltd
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 1 July 2008
JEI Vol. 17 Issue 03
KEYWORDS: Visibility, Visualization, Thin films, Transistors, Inspection, Defect detection, Detection and tracking algorithms, Liquid crystals, LCDs, Feature extraction

Proceedings Article | 26 February 2008
Proc. SPIE. 6813, Image Processing: Machine Vision Applications
KEYWORDS: Eye, Edge detection, Defect detection, Detection and tracking algorithms, Sensors, Image segmentation, Image processing, Manufacturing, LCDs, Image filtering

Proceedings Article | 18 January 2006
Proc. SPIE. 6066, Vision Geometry XIV
KEYWORDS: Visual process modeling, Detection and tracking algorithms, Visualization, Complex systems, Manufacturing, Inspection, Optical inspection, Distance measurement, Computer engineering, Visibility

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