Dr. Nobukazu Yoshikawa
at Musashi Inst of Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 November 2003
Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life
KEYWORDS: Fringe analysis, Electronics, Facial recognition systems, 3D acquisition, Fourier transforms, 3D metrology, Object recognition, Target recognition, Optical correlators, Communication engineering

Proceedings Article | 30 September 2003
Proc. SPIE. 5264, Optomechatronic Systems IV
KEYWORDS: Fringe analysis, 3D acquisition, Cameras, Reflectivity, Fourier transforms, 3D metrology, Projection systems, Object recognition, Optical correlators, 3D image processing

Proceedings Article | 8 May 2001
Proc. SPIE. 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
KEYWORDS: Fringe analysis, 3D acquisition, 3D image enhancement, Spatial frequencies, Fourier transforms, 3D metrology, Object recognition, Image enhancement, Optical correlators, 3D image processing

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