Dr. Noel Ivan Toto-Arellano
Research Professor at Univ Tecnológica de Tulancingo
SPIE Involvement:
Author
Area of Expertise:
Interferometry , Fourier optics , Phase shifting interferometry , Holography , Polarization , Electronic speckle pattern interferometry
Profile Summary

Noel-Ivan Toto-Arellano received his BS degree in Physical Sciences at Universidad Veracruzana, México, his MSc in Optical Sciences from Benemérita Universidad Autónoma de Puebla (Puebla, México, 2005), and his PhD in Optical Sciences at the same institution (2008). He did two post-doctoral internships at CIO (León, Gto. México, 2009 – 2011). He currently holds a research professor position at the Universidad Tecnológica de Tulancingo, Hidalgo, México, supporting the creation of a First Optics and Photonics Engineering program in Mexico. He has authored 35 articles in interferometry and Fourier optics, five book chapters, and two handbooks. He holds three national science and technology awards
and two medals for innovations granted by the Mexican Institute of Industrial Property. He is a researcher at Centro de Tecnologias Opticas y Fotonicas (CTOF), a member of the National System of Researchers, Mexico, Mexican Academy of Optics, Mexican Academy of Sciencies, SPIE and OSA. His current research interests include education in optics and photonics, physical optics, interferometry, laser applications, image formation (spatial filtering, holography and tomography), Fourier optics, and optical metrology using moiré and speckle interferometry, contouring for structured light projection.
Publications (14)

SPIE Journal Paper | September 12, 2017
OE Vol. 56 Issue 09
KEYWORDS: Interferometers, Phase shifts, Polarizers, Optical testing, Mirrors, Polarization, Phase shift keying, Wavefronts, Phase shifting, Cameras

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9204, Interferometry XVII: Advanced Applications
KEYWORDS: Fringe analysis, Phase shifting, Polarization, Interferometry, Phase interferometry, Ronchi rulings, Charge-coupled devices, Temperature metrology, Phase shifts, Michelson interferometers

SPIE Journal Paper | February 28, 2014
OE Vol. 53 Issue 11
KEYWORDS: Temperature metrology, Polarization, Phase shifts, Phase shift keying, Fringe analysis, Ronchi rulings, Interferometry, Refractive index, Interferometers, Linear polarizers

PROCEEDINGS ARTICLE | November 18, 2013
Proc. SPIE. 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications
KEYWORDS: Mirrors, Beam splitters, Phase shifting, Polarization, Interferometers, Cameras, Wavefronts, Wave plates, Phase interferometry, Phase shifts

PROCEEDINGS ARTICLE | October 15, 2013
Proc. SPIE. 8884, Optifab 2013
KEYWORDS: Phase shifting, Modulation, Polarization, Interferometers, Interferometry, Phase shift keying, Linear filtering, Phase interferometry, Phase measurement, Phase shifts

SPIE Journal Paper | May 4, 2012
OE Vol. 51 Issue 5
KEYWORDS: Phase shift keying, Interferometers, Phase measurement, Phase shifts, Diffraction gratings, Modulation, Polarization, Phase interferometry, Optical filters, Linear filtering

Showing 5 of 14 publications
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