Dr. Norio Saito
at National Institute of Advanced Industrial Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 April 2019
Proc. SPIE. 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
KEYWORDS: X-rays, Diagnostics, X-ray detectors, Hard x-rays, Free electron lasers, Power meters

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