Norman G. Worku
Optics Designer at tooz Technologies GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 August 2017 Paper
Proceedings Volume 10347, 103470W (2017) https://doi.org/10.1117/12.2273919
KEYWORDS: Polarization, Gaussian beams, Ray tracing, Beam propagation method, Systems modeling, Microscopes, Jones vectors

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