Ojas P. Kulkarni
Design Engineer at Intel Corp
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 1 December 2010
OE Vol. 49 Issue 12
KEYWORDS: Metals, Scattering, Defect detection, Inspection, Light scattering, Sensors, Laser scattering, Manufacturing, GRIN lenses, Surface finishing

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