Prof. Oleg V. Angelsky
Head of Dept of Correlation Optics at Yuriy Fedkovych Chernivtsi National Univ
SPIE Involvement:
Fellow status | Conference Chair | Conference Program Committee | Symposium Chair | Author | Editor | Student Chapter Advisor
Publications (142)

PROCEEDINGS ARTICLE | September 11, 2018
Proc. SPIE. 10723, Optical Trapping and Optical Micromanipulation XV
KEYWORDS: Prisms, Polarization, Reflection, Blood, Nanoparticles, Interfaces, Computer simulations, Wave propagation, Optical tweezers, Plasma

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10723, Optical Trapping and Optical Micromanipulation XV
KEYWORDS: Polarization, Particles, Crystals, Dielectrics, Polarizers, Semiconductor lasers, Laser crystals, Calcite, Beam propagation method, Dielectric polarization

SPIE Conference Volume | January 24, 2018

PROCEEDINGS ARTICLE | January 18, 2018
Proc. SPIE. 10612, Thirteenth International Conference on Correlation Optics
KEYWORDS: Refractive index, Continuous wave operation, Nanoparticles, Water, Glasses, Particles, CCD cameras, Infrared radiation, Laser damage threshold, Liquids

PROCEEDINGS ARTICLE | August 25, 2017
Proc. SPIE. 10347, Optical Trapping and Optical Micromanipulation XIV
KEYWORDS: Coherence (optics), Particles, Crystals, Dielectrics, Robotics, Diagnostics, Micro optics, Beam propagation method, Dielectric polarization, Nano optics

PROCEEDINGS ARTICLE | December 14, 2016
Proc. SPIE. 10010, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII
KEYWORDS: Optical components, 3D image reconstruction, Speckle, Computer simulations, Phase retrieval, Speckle pattern, Free space optics, Reconstruction algorithms, Signal analyzers, Spiral phase plates

Showing 5 of 142 publications
Conference Committee Involvement (28)
Fourteenth International Conference on Correlation Optics
16 September 2019 | Chernivtsi, Ukraine
Correlation Optics 2017
11 September 2017 | Chernivtsi, Ukraine
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Correlation Optics 2015
14 September 2015 | Chernivsti, Ukraine
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Showing 5 of 28 published special sections
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