Dr. Oleg F. Vyvenko
at St Petersburg State Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 June 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Contamination, Metals, Ions, Electron microscopes, Platinum, Scanning electron microscopy, Scanning helium ion microscopy, Solids, Helium, Molybdenum

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top