Ms. Olga V. Pyatilova
at MIET
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | December 30, 2016
Proc. SPIE. 10224, International Conference on Micro- and Nano-Electronics 2016
KEYWORDS: Diffraction, Nanostructuring, Statistical analysis, Metals, X-rays, Nickel, Silicon, Heat treatments, Chemical analysis, Plating

PROCEEDINGS ARTICLE | December 30, 2016
Proc. SPIE. 10224, International Conference on Micro- and Nano-Electronics 2016
KEYWORDS: Nanostructuring, Detection and tracking algorithms, Etching, Metals, Nickel, Silicon, Silver, Silicon films, Wet etching, Semiconducting wafers

PROCEEDINGS ARTICLE | December 30, 2016
Proc. SPIE. 10224, International Conference on Micro- and Nano-Electronics 2016
KEYWORDS: Detection and tracking algorithms, Etching, Metals, Silicon, Scanning electron microscopy, Solids, Adsorption, Fractal analysis, Wet etching, Thermodynamics

PROCEEDINGS ARTICLE | December 18, 2014
Proc. SPIE. 9440, International Conference on Micro- and Nano-Electronics 2014
KEYWORDS: Polishing, Nanostructuring, Etching, Molecules, Silicon, Scanning electron microscopy, Atmospheric physics, Humidity, Semiconducting wafers, Chemisorption

PROCEEDINGS ARTICLE | December 18, 2014
Proc. SPIE. 9440, International Conference on Micro- and Nano-Electronics 2014
KEYWORDS: Thin films, Switching, Metals, Copper, Ions, Chalcogenides, Atomic force microscopy, Scanning electron microscopy, Bismuth, Thin film deposition

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