Dr. Oliver Brunke
at GE Inspection Technologies GmbH
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 20, 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Calibration, X-rays, Inspection, Distance measurement, 3D metrology, Dimensional metrology, Computed tomography

PROCEEDINGS ARTICLE | September 16, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: X-ray computed tomography, Sensors, X-rays, Copper, Bone, Computed tomography, Synchrotrons, Spatial resolution, Synchrotron radiation, Absorption

PROCEEDINGS ARTICLE | September 15, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Polymethylmethacrylate, Cartilage, Tissues, Image segmentation, X-rays, 3D modeling, Bone, Computed tomography, Spatial resolution, Absorption

PROCEEDINGS ARTICLE | October 26, 2004
Proc. SPIE. 5535, Developments in X-Ray Tomography IV
KEYWORDS: Polyurethane, Foam, Cameras, Polymers, X-rays, CCD cameras, Tomography, Charge-coupled devices, Synchrotron radiation, Absorption

PROCEEDINGS ARTICLE | October 26, 2004
Proc. SPIE. 5535, Developments in X-Ray Tomography IV
KEYWORDS: Foam, Particles, Tomography, Aluminum, Synchrotrons, Spatial resolution, Synchrotron radiation, 3D image processing, Liquids, Absorption

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