Dr. Oliver Bunk
at Paul Scherrer Institut
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 18 September 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Coherence imaging, Refractive index, Light sources, X-rays, X-ray microscopy, Tomography, Reconstruction algorithms, Algorithm development, X-ray imaging, X-ray characterization

SPIE Journal Paper | 2 July 2012
JNP Vol. 6 Issue 01
KEYWORDS: Anisotropy, Annealing, Scattering, Crystals, Polymers, X-rays, Polarizers, Optical testing, Polymer thin films, Nanostructures

Proceedings Article | 3 November 2011
Proc. SPIE. 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World
KEYWORDS: Coherence imaging, X-ray computed tomography, X-rays, X-ray diffraction, X-ray microscopy, Tomography, Image quality, Algorithm development, X-ray imaging, Absorption

Proceedings Article | 28 September 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Electron beam lithography, Coherence imaging, X-ray optics, X-rays, X-ray diffraction, Reconstruction algorithms, Spatial resolution, Zone plates, Hard x-rays, Iridium

Proceedings Article | 13 May 2010
Proc. SPIE. 7716, Micro-Optics 2010
KEYWORDS: Prisms, X-ray optics, Lenses, Polymers, X-rays, X-ray microscopy, X-ray imaging, X-ray lithography, Photorefractive polymers, Synchrotron technology

Showing 5 of 13 publications
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