Mr. Oliver Hofherr
at Univ of Freiburg
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Reflectors, Monochromatic aberrations, Refractive index, Eye, Retroreflectors, Interferometers, Sensors, Distance measurement, Wavefront distortions, Active optics

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Beam splitters, Retroreflectors, Interferometers, Sensors, Optical testing, Semiconductor lasers, Distance measurement, Signal detection, Prototyping, Beam analyzers

PROCEEDINGS ARTICLE | October 25, 2012
Proc. SPIE. 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
KEYWORDS: Reflectors, Eye, Retroreflectors, Modulation, Sensors, Calibration, Field programmable gate arrays, Semiconductor lasers, Helium neon lasers, Prototyping

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