Oliver Scholz
at Fraunhofer Gesellschaft
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | July 22, 2003
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Detection and tracking algorithms, X-rays, Manufacturing, Reliability, Inspection, Tomography, Integrated circuits, X-ray imaging, Spherical lenses, 3D image processing

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