Dr. Olivier Hignette
Senior Engineer at ESRF
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 29 August 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Mirrors, Diffraction, Multilayers, Reflection, Reflectivity, X-rays, Refraction, Coating, Synchrotrons, X-ray optics

Proceedings Article | 17 September 2005
Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics
KEYWORDS: Mirrors, Silicon, Metrology, Data conversion, Error analysis, Sensors, X-rays, Fourier transforms, Optical metrology, Synchrotron radiation

Proceedings Article | 17 September 2005
Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics
KEYWORDS: Mirrors, Metrology, Head, Interferometers, Platinum, X-rays, Calibration, Interferometry, Optical components, Optical testing

Proceedings Article | 23 December 2003
Proc. SPIE. 5195, Crystals, Multilayers, and Other Synchrotron Optics
KEYWORDS: Crystals, Surface finishing, Diffraction, Laser crystals, Polishing, X-rays, X-ray diffraction, Silicon, Monochromators, Etching

Proceedings Article | 24 December 2002
Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II
KEYWORDS: Mirrors, X-rays, Silicon, Multilayers, Reflectivity, Platinum, Californium, Interfaces, Alignment procedures, Actuators

Showing 5 of 18 publications
Conference Committee Involvement (4)
Advances in Metrology for X-Ray and EUV Optics II
30 August 2007 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components II
27 August 2007 | San Diego, California, United States
Advances in X-Ray/EUV Optics, Components, and Applications
14 August 2006 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
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