Dr. Olivier Legras
R&D Director at ULIS
SPIE Involvement:
Author
Publications (22)

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Amorphous silicon, Packaging, Readout integrated circuits, Microbolometers, Sun, Sensors, Interfaces, Resistance, Electro optics, Temperature metrology

PROCEEDINGS ARTICLE | September 24, 2009
Proc. SPIE. 7481, Electro-Optical and Infrared Systems: Technology and Applications VI
KEYWORDS: Staring arrays, Amorphous silicon, Packaging, Readout integrated circuits, Microbolometers, Thermography, Infrared sensors, Sensors, Ceramics, Temperature metrology

PROCEEDINGS ARTICLE | October 2, 2008
Proc. SPIE. 7113, Electro-Optical and Infrared Systems: Technology and Applications V
KEYWORDS: Staring arrays, Amorphous silicon, Readout integrated circuits, Microbolometers, Thermography, Sensors, Amplifiers, Electro optics, Temperature metrology, Standard readout integrated circuits

PROCEEDINGS ARTICLE | September 27, 2008
Proc. SPIE. 7100, Optical Design and Engineering III
KEYWORDS: Staring arrays, Amorphous silicon, Bolometers, Readout integrated circuits, Infrared detectors, Microbolometers, Sensors, Analog electronics, Camera shutters, Temperature metrology

PROCEEDINGS ARTICLE | May 3, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Staring arrays, Amorphous silicon, Bolometers, Readout integrated circuits, Microbolometers, Sensors, Analog electronics, Electro optics, Camera shutters, Temperature metrology

PROCEEDINGS ARTICLE | May 3, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Staring arrays, Amorphous silicon, Readout integrated circuits, Microbolometers, Optical design, Sensors, Amplifiers, Detector development, Temperature metrology, Standard readout integrated circuits

Showing 5 of 22 publications
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