Dr. Olov von Hofsten
Optics Specialist, Partner at Eclipse Optics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 April 2024 Presentation + Paper
Rickard Brunskog, Michael Bertilson, Olov von Hofsten, Mats Persson
Proceedings Volume 12925, 129250H (2024) https://doi.org/10.1117/12.3005509
KEYWORDS: Sensors, Signal attenuation, X-ray computed tomography, Visibility, Signal detection, Phase reconstruction, X-rays, Computed tomography, Medical imaging

Proceedings Article | 20 September 2007 Paper
Proceedings Volume 6705, 67050I (2007) https://doi.org/10.1117/12.734003
KEYWORDS: Microscopes, X-rays, Zone plates, Monochromatic aberrations, Image acquisition, X-ray microscopy, X-ray imaging, Point spread functions, Objectives, Coherence (optics)

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