Dr. Ondrej E. Cibulka
at Univ of West Bohemia
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 19, 2011
Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III
KEYWORDS: Sensors, Laser energy, Copper, Silicon, Reflectivity, Laser damage threshold, Radiometry, Pulsed laser operation, Temperature metrology, Plasma

PROCEEDINGS ARTICLE | June 7, 2006
Proc. SPIE. 6261, High-Power Laser Ablation VI
KEYWORDS: Thermography, Sensors, Copper, Nickel, Silicon, Reflectivity, Solids, Pulsed laser operation, Temperature metrology, Liquids

PROCEEDINGS ARTICLE | June 21, 2004
Proc. SPIE. 5449, Eighth International Conference on Laser and Laser Information Technologies
KEYWORDS: Semiconductors, Optical properties, Luminescence, Reflectivity, Laser irradiation, Solids, Laser crystals, Ruby lasers, Temperature metrology, Liquids

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