Dr. Ondrej Zivotsky
at Technical Univ of Ostrava
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 12, 2009
Proc. SPIE. 7353, Metamaterials IV
KEYWORDS: FT-IR spectroscopy, Oscillators, Data modeling, Optical properties, Spectroscopy, Crystals, Dielectrics, Reflectivity, Photonic crystals, Perovskite

PROCEEDINGS ARTICLE | November 18, 2008
Proc. SPIE. 7138, Photonics, Devices, and Systems IV
KEYWORDS: Optical microscopes, Refractive index, Data modeling, Sensors, Microscopy, Magnetism, Kerr effect, Magnetic sensors, Geometrical optics, Anisotropy

PROCEEDINGS ARTICLE | May 16, 2007
Proc. SPIE. 6585, Optical Sensing Technology and Applications
KEYWORDS: Multilayers, Polishing, Data modeling, Polarization, Annealing, Magnetism, Kerr effect, Geometrical optics, Magneto-optics, Surface finishing

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Ellipsometry, Statistical analysis, Phase modulation, Modulation, Birefringence, Calibration, Polarizers, Modulators, Precision measurement, Photoelastic modulators

PROCEEDINGS ARTICLE | April 7, 2004
Proc. SPIE. 5445, Microwave and Optical Technology 2003

PROCEEDINGS ARTICLE | July 8, 2003
Proc. SPIE. 5036, Photonics, Devices, and Systems II
KEYWORDS: Multilayers, Jones matrices, Coherence (optics), Polarization, Sensors, Matrices, Interfaces, Magneto-optics, Jones vectors, Anisotropy

Showing 5 of 6 publications
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