Prof. Ono Satoshi
at Kagoshima Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 14, 2017
Proc. SPIE. 10338, Thirteenth International Conference on Quality Control by Artificial Vision 2017
KEYWORDS: Edge detection, Convolutional neural networks, Sensors, Distortion, Feature extraction, Wave propagation, Light sources and illumination, Machine vision, Biomedical engineering, Information science

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