Dr. Ophir Almog
at Technion-Israel Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 September 2009
Proc. SPIE. 7477, Image and Signal Processing for Remote Sensing XV
KEYWORDS: Signal to noise ratio, Hyperspectral imaging, Principal component analysis, Wavelets, Reliability, Reflectivity, Vegetation, Signal processing, Image classification, Signal analyzers

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