Dr. Ophir Frieder
at Illinois Institute of Technology
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 18 January 2010
Proc. SPIE. 7534, Document Recognition and Retrieval XVII
KEYWORDS: Shape analysis, Feature selection, Neural networks, Image filtering, Algorithm development, Visualization, Bismuth, Expectation maximization algorithms, Digital filtering, Binary data

Proceedings Article | 18 January 2010
Proc. SPIE. 7534, Document Recognition and Retrieval XVII
KEYWORDS: Image quality, Optical character recognition, Speckle, Image segmentation, Image processing, Quality measurement, Data modeling, Computer science, Visualization, Java

Proceedings Article | 19 January 2009
Proc. SPIE. 7247, Document Recognition and Retrieval XVI
KEYWORDS: Image enhancement, Shape analysis, Image segmentation, Binary data, Digital filtering, Image restoration, Expectation maximization algorithms, Image classification, Image quality, Algorithm development

Proceedings Article | 28 January 2008
Proc. SPIE. 6815, Document Recognition and Retrieval XV
KEYWORDS: Image segmentation, Image enhancement, Image processing, Systems modeling, Performance modeling, Legal, Image quality, Data modeling, Chromium, Bismuth

Proceedings Article | 28 January 2008
Proc. SPIE. 6815, Document Recognition and Retrieval XV
KEYWORDS: Binary data, Image segmentation, Image filtering, Image enhancement, Image processing, Systems modeling, Expectation maximization algorithms, Legal, Image classification, Computer security

Showing 5 of 8 publications
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