Dr. Osami Sasaki
Emeritus Professor
SPIE Involvement:
Publications (99)

Proceedings Article | 8 December 2022 Paper
Haosen Pu, Osami Sasaki, Takamasa Suzuki, Samuel Choi
Proceedings Volume 12480, 124800B (2022) https://doi.org/10.1117/12.2660168
KEYWORDS: Spiral phase plates, Phase shift keying, Interferometry, Scanning probe microscopy, Phase measurement, Optical vortices, Spatial light modulators, Phase modulation, Gaussian beams, Computer generated holography

Proceedings Article | 1 November 2021 Paper
Takamasa Suzuki, Jiro Shimazaki, Osami Sasaki, Samuel Choi
Proceedings Volume 12057, 120574L (2021) https://doi.org/10.1117/12.2606987
KEYWORDS: Signal detection, Continuous wavelet transforms, Mirrors, Optical coherence tomography, Signal processing, Ferroelectric materials, Continuous wave operation, Wavelets, 3D metrology, Light sources

Proceedings Article | 9 October 2021 Presentation + Paper
Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Jixiong Pu
Proceedings Volume 11899, 118990A (2021) https://doi.org/10.1117/12.2601233
KEYWORDS: Signal detection, Glasses, Fourier transforms, Interferometers, Spectral resolution, Phase measurement

SPIE Journal Paper | 26 March 2020
OE, Vol. 59, Issue 03, 034112, (March 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.3.034112
KEYWORDS: Interferometers, Phase shifts, Signal detection, CCD cameras, Digital signal processing, Cameras, Signal processing, Optical engineering, Phase shift keying, Modulation

SPIE Journal Paper | 23 October 2019
Takamasa Suzuki, Nariyasu Sugawara, Samuel Choi, Osami Sasaki
OE, Vol. 58, Issue 10, 104108, (October 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.10.104108
KEYWORDS: Semiconductor lasers, Continuous wavelet transforms, Optical coherence tomography, Diffraction gratings, Diffraction, Mirrors, Acousto-optics, Modulation, Wavelets, Ferroelectric materials

Showing 5 of 99 publications
Conference Committee Involvement (4)
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Advanced Materials and Devices for Sensing and Imaging III
12 November 2007 | Beijing, China
Advanced Materials and Devices for Sensing and Imaging II
8 November 2004 | Beijing, China
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