Dr. Osami Sasaki
Emeritus Professor at
SPIE Involvement:
Fellow status | Conference Program Committee | Author
Publications (94)

PROCEEDINGS ARTICLE | November 8, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Light sources, Interferometers, Cameras, Fourier transforms, Photodiodes, Signal processing, Phase measurement, Signal detection, Bandpass filters

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Light sources, Ferroelectric materials, Interferometers, Sensors, Fourier transforms, Interferometry, Interference (communication), Signal processing, Phase measurement, Signal detection

SPIE Journal Paper | August 21, 2014
OE Vol. 53 Issue 08
KEYWORDS: Interferometry, Interferometers, 3D scanning, Phase interferometry, Phase shifts, Signal detection, Charge-coupled devices, Phase measurement, Mirrors, Avalanche photodetectors

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Visible radiation, Spatial frequencies, Interferometers, Optical coherence tomography, Semiconductor lasers, CCD cameras, Image sensors, Optical alignment, Cylindrical lenses, Acousto-optics

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Mirrors, Phase shifting, Avalanche photodetectors, Interferometers, Fourier transforms, Interferometry, 3D metrology, Charge-coupled devices, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | December 19, 2013
Proc. SPIE. 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mirrors, Beam splitters, Ferroelectric materials, Interferometers, Semiconductor lasers, Electronic components, Diodes, Charge-coupled devices, Continuous wavelet transforms, Michelson interferometers

Showing 5 of 94 publications
Conference Committee Involvement (4)
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Advanced Materials and Devices for Sensing and Imaging III
12 November 2007 | Beijing, China
Advanced Materials and Devices for Sensing and Imaging II
8 November 2004 | Beijing, China
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